In situ characterization of atomic layer deposition of SrTiO3

Citation
A. Rahtu et al., In situ characterization of atomic layer deposition of SrTiO3, J PHYS IV, 11(PR3), 2001, pp. 923-930
Citations number
25
Categorie Soggetti
Physics
Journal title
JOURNAL DE PHYSIQUE IV
ISSN journal
11554339 → ACNP
Volume
11
Issue
PR3
Year of publication
2001
Pages
923 - 930
Database
ISI
SICI code
1155-4339(200108)11:PR3<923:ISCOAL>2.0.ZU;2-X
Abstract
The reaction mechanisms in the atomic layer deposition of SrO and SrTiO3 We re studied with a quartz crystal microbalance and a quadrupole mass spectro meter at 325 degreesC. The precursors were Sr((C5Pr3H2)-Pr-i)(2), Ti(OCH(CH 3)(2))(4) and deuterated water. The main gaseous byproduct was (C5Pr3H2D)-P r-i. When SrO was grown on TiO2, the TiO2 surface affected the growth until it became covered with SrO. By contrast, the SrO surface did not have as s ignificant effect to the growth of TiO2.