Theoretical research of electron-density measurements of plane targets using soft XRL deflectometry

Citation
C. Ye et al., Theoretical research of electron-density measurements of plane targets using soft XRL deflectometry, J PHYS IV, 11(PR2), 2001, pp. 479-481
Citations number
4
Categorie Soggetti
Physics
Journal title
JOURNAL DE PHYSIQUE IV
ISSN journal
11554339 → ACNP
Volume
11
Issue
PR2
Year of publication
2001
Pages
479 - 481
Database
ISI
SICI code
1155-4339(200107)11:PR2<479:TROEMO>2.0.ZU;2-A
Abstract
In recent years, saturated Ne-like and Ni-like XRL were reached by double-p ulse driving scheme using less energy. These provide convenient source for XRL applications. In this paper, we present calculations for experiments th at measure electron-densities of plasmas produced by double-pulse laser wit h soft XRL moire deflectometry. Using JB 19 code etc., we simulate the hydr odynamics of plane targets radiated by double-pulse laser, obtained the def lection angles of the probing beam for different times, and discuss the pos sibility of getting valuable information by XRL Moore deflectometry.