MWP-fit: a program for multiple whole-profile fitting of diffraction peak profiles by ab initio theoretical functions

Citation
G. Ribarik et al., MWP-fit: a program for multiple whole-profile fitting of diffraction peak profiles by ab initio theoretical functions, J APPL CRYS, 34, 2001, pp. 669-676
Citations number
46
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
34
Year of publication
2001
Part
5
Pages
669 - 676
Database
ISI
SICI code
0021-8898(200110)34:<669:MAPFMW>2.0.ZU;2-S
Abstract
A computer program has been developed for the determination of micro-struct ural parameters from diffraction profiles of materials with cubic or hexago nal crystal lattices. The measured profiles or their Fourier transforms are fitted by ab initio theoretical functions for size and strain broadening. In the calculation of the theoretical functions, it is assumed that the cry stallites have log-normal size distribution and that the strain is caused b y dislocations. Strain and size anisotropy are taken into account by the di slocation contrast factors and the ellipticity of the crystallites. The fit ting procedure provides the median and the variance of the size distributio n and the ellipticity of the crystallites, and the density and arrangement of the dislocations. The efficiency of the program is illustrated by exampl es of severely deformed copper and ball-milled lead sulfide specimens.