Ballistic hole transport in pentacene with a mean free path exceeding 30 mu m

Citation
Jh. Schon et al., Ballistic hole transport in pentacene with a mean free path exceeding 30 mu m, J APPL PHYS, 90(7), 2001, pp. 3419-3421
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
90
Issue
7
Year of publication
2001
Pages
3419 - 3421
Database
ISI
SICI code
0021-8979(20011001)90:7<3419:BHTIPW>2.0.ZU;2-P
Abstract
Low temperature ballistic hole transport in high-quality pentacene single c rystals is studied using macroscopic gated four-terminal van-der-Pauw geome try and two-terminal conventional field-effect transistor structures. Well- pronounced magnetic focusing peaks are observed in the magnetoresistance of van-der-Pauw samples indicating ballistic transport up to at least 45 mum. At low temperature the field-effect transistors show saturation currents i ndependent of the channel length and proportional to the channel width. The transistor characteristics are consistently analyzed assuming ballistic tr ansport of holes throughout the whole length of the channel. (C) 2001 Ameri can Institute of Physics.