Gy. Jung et al., Lifetime studies of light-emitting diode structures incorporating polymeric Langmuir-Blodgett films, MAT SCI E C, 14(1-2), 2001, pp. 1-10
The operating lifetimes of light-emitting diode structures incorporating po
ly(2-methoxy-5-(2'-ethylhexyloxy)-p-phenylenevinylene) (MEH-PPV) Langmuir-B
lodgett films are reported. To remove the moisture from the organic layer,
a number of post-deposition treatments have been investigated prior to the
deposition of the metal top contact. The best external quantum efficiency w
as found for an indium-tin oxide/MEH-PPV/aluminium structure dried in high
vacuum. However, this device possessed a relatively short lifetime. Experim
ents at constant current and constant voltage revealed that annealing at an
elevated temperature could enhance the lifetime. Further improvements were
found for devices in which a lithium fluoride layer (approximate to 2 nm)
was sandwiched between the aluminium electrode and the polymer layer, and b
y encapsulating the device with adhesive tape. (C) 2001 Elsevier Science B.
V. All rights reserved.