Modeling of very high-frequency effects in the interconnection delays on GaAs-based VLSICs

Citation
Ak. Goel et Se. Weitemeyer, Modeling of very high-frequency effects in the interconnection delays on GaAs-based VLSICs, MICROW OPT, 31(3), 2001, pp. 229-233
Citations number
6
Categorie Soggetti
Optics & Acoustics
Journal title
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
ISSN journal
08952477 → ACNP
Volume
31
Issue
3
Year of publication
2001
Pages
229 - 233
Database
ISI
SICI code
0895-2477(20011105)31:3<229:MOVHEI>2.0.ZU;2-E
Abstract
In this paper, a model of the propagation delays in the interconnection lin es on GaAs-based very high-speed integrated circuits is presented. The mode l includes the very high frequency effects, such as geometric dispersion, s ubstrate losses, and conductor losses. The model is used to simulate the de pendence of interconnect delays on the frequency of operation, interconnect length, width, material resistivity, load capacitance, and the driving sou rce resistance. (C) 2001 John Wiley & Sons, Inc.