X-ray diffraction microtomography using synchrotron radiation

Citation
Rc. Barroso et al., X-ray diffraction microtomography using synchrotron radiation, NUCL INST A, 471(1-2), 2001, pp. 75-79
Citations number
6
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
471
Issue
1-2
Year of publication
2001
Pages
75 - 79
Database
ISI
SICI code
0168-9002(20010921)471:1-2<75:XDMUSR>2.0.ZU;2-K
Abstract
The X-ray diffraction computed tomography technique is based on the interfe rence phenomena of the coherent scatter. For low-momentum transfer, it is m ost probable that the scattering interaction will be coherent. A selective discrimination of a given element in a scanned specimen can be realized by fixing the Bragg angle which produces an interference peak and then, to car ry out the computed tomography in the standard mode. The image reconstructe d exalts the presence of this element with respect to other ones in a sampl e. This work reports the feasibility of a nondestructive synchrotron radiat ion X-ray diffraction imaging technique. This research was performed at the X-ray Diffraction beam line of the National Synchrotron Light Laboratory ( LNLS) in Brazil. The coherent scattering properties of different tissue and bone substitute materials were evaluated. Furthermore, diffraction pattern s of some polycrystalline solids were studied due to industrial and environ mental human exposure to these metals. The obtained diffraction patterns fo rm the basis of a selective tomography technique. Preliminary images are pr esented. (C) 2001 Elsevier Science B.V. All rights reserved.