Properties of Tl2Ba2CaCu2O8 thin film intrinsic Josephson junctions in an in-plane magnetic field

We have performed transport measurements on intrinsic Josephson junctions i n misaligned thin films of Tl2Ba2CaCu2O8. This has been done in both zero f ield and in-plane aligned magnetic fields of up to 5 T. We have compared we t-etched and ion-milled devices and find that the more precise structure pr oduced by ion-milling gives superior results. In the case of ion-milled dev ices we are able to individually switch on up to 50 junctions. For an n-pla ne field of 3 T there is complete suppression of the critical current. We h ave seen displaced branches for in-plane fields above 1.5 T. This branching is due to Josephson flux flow. For in-plane fields greater than 2 T the re lationship between the maximum flux-flow voltage and the applied field is l inear. (C) 2001 Elsevier Science B.V. All rights reserved.