Si. Bozhevolnyi et V. Coello, Statistics of local field intensity enhancements at nanostructured surfaces investigated with a near-field optical microscope - art. no. 115414, PHYS REV B, 6411(11), 2001, pp. 5414
Near-field intensity distributions measured at nanostructured surfaces with
a scanning near-field optical microscope are treated to determine the stat
istics of local field intensity enhancements. The probability density funct
ion (PDF) of the field intensity enhancement is calculated for surface-plas
mon-polariton scattering by randomly rough surfaces of thin metal films and
for light scattering in silver colloid fractals. We demonstrate that the s
tatistics of the intensity distributions established in different scatterin
g regimes, viz., single and multiple scattering, is distinctly different, a
nd compare our results with the theoretical predictions available. We show
that. in the regime of multiple scattering, the PDF decreases exponentially
for large values of the intensity enhancement with the slope for surface-p
lasmon scattering being significantly different from that for light scatter
ing in surface fractal structures. We also find that, in the latter case, t
he PDF slope is only weakly influenced by variations in the wavelength and
polarization of incident radiation.