High-frequency mechanical spectroscopy with an atomic force microscope

Citation
E. Dupas et al., High-frequency mechanical spectroscopy with an atomic force microscope, REV SCI INS, 72(10), 2001, pp. 3891-3897
Citations number
20
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN journal
00346748 → ACNP
Volume
72
Issue
10
Year of publication
2001
Pages
3891 - 3897
Database
ISI
SICI code
0034-6748(200110)72:10<3891:HMSWAA>2.0.ZU;2-E
Abstract
In this article we further develop local mechanical spectroscopy and extend the frequency range over which it can be used. Using a heterodyne method t o measure the deflection of the cantilever enables one to measure the probe vibration at any frequency. Since the detection sensitivity of force gradi ents follows a f(2) dependence, extending the frequency range from 1 to mor e than 5 MHz increases the sensitivity by over an order of magnitude. This setup is combined with a realistic model of the cantilever taking into acco unt the geometry of the cantilever. The model is presented and discussed, a nd compared with experimental behavior measured on WC-Co and NiTi-epoxy sam ples. Experimental moduli of 730+/-50 and 260+/-40 GPa are obtained for WC and Co, respectively. (C) 2001 American Institute of Physics.