High critical current densities in superconducting MgB2 thin films

Citation
Sh. Moon et al., High critical current densities in superconducting MgB2 thin films, APPL PHYS L, 79(15), 2001, pp. 2429-2431
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
15
Year of publication
2001
Pages
2429 - 2431
Database
ISI
SICI code
0003-6951(20011008)79:15<2429:HCCDIS>2.0.ZU;2-0
Abstract
Superconducting MgB2 thin films were prepared on Al2O3(0001) and MgO(100) s ubstrates. Boron thin films were deposited by the electron-beam evaporation followed by postannealing process with magnesium. Proper postannealing con ditions were investigated to grow good superconducting MgB2 thin films. The x-ray diffraction patterns showed randomly oriented growth of MgB2 phase i n our thin films. The surface morphology was examined by scanning electron microscope and atomic force microscope. Critical current density (J(C)) mea sured by transport method was about 10(7) A/cm(2) at 15 K, and superconduct ing transition temperature (T-C) was similar to 39 K in the MgB2 thin films on Al2O3. (C) 2001 American Institute of Physics.