Single molecule DNA device measured with triple-probe atomic force microscope

Citation
H. Watanabe et al., Single molecule DNA device measured with triple-probe atomic force microscope, APPL PHYS L, 79(15), 2001, pp. 2462-2464
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
15
Year of publication
2001
Pages
2462 - 2464
Database
ISI
SICI code
0003-6951(20011008)79:15<2462:SMDDMW>2.0.ZU;2-B
Abstract
We have measured the electric properties of a three-terminal single molecul e DNA device with a triple-probe atomic force microscope (T-AFM). The T-AFM permits us to connect a single DNA molecule with carbon nanotube (CNT) ele ctrodes as source, drain, and gate terminals. As the gate bias voltage is i ncreased, the voltage gap region decreased in the current-voltage (I-V) cur ves. Furthermore, we can observe the clear steps in the I-V curve at crossi ng the DNA molecule and the CNT-gate electrode with gate biased. (C) 2001 A merican Institute of Physics.