Boron-doped diamond films were grown by hot-filament-assisted chemical vapo
r deposition (CVD). The fractal dimension (FD) of these films was investiga
ted by atomic force microscope and cyclic voltammetry. The scaling behavior
is measured for peak current in cyclic voltammetry, height-height correlat
ions and island size distribution in AFM images. Cyclic voltammetry experim
ents and the mass-radius (or island distribution) analysis have evidenced F
D values lower than two suggesting non-contiguous chemically active sites.
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