High-power highly reliable Al-free 940-nm diode lasers

Citation
G. Erbert et al., High-power highly reliable Al-free 940-nm diode lasers, IEEE S T QU, 7(2), 2001, pp. 143-148
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
ISSN journal
1077260X → ACNP
Volume
7
Issue
2
Year of publication
2001
Pages
143 - 148
Database
ISI
SICI code
1077-260X(200103/04)7:2<143:HHRA9D>2.0.ZU;2-0
Abstract
Al-free diode lasers emitting at 940 nm having a broadened step-index waveg uide structure and a single active InGaAs quantum well have been realized b y MOVPE. The impact of waveguide thickness on device performance has been s tudied. The highest wall plug efficiency of about 60% has been obtained wit h diode lasers having a 1-mum-thick waveguide. Increasing the waveguide thi ckness to 1.5 mum resulted in record low degradation rates below 10(-5) h(- 1) for 3-W output power (100 mum stripe width). The same diode lasers showe d a good long-term reliability even at an output power of 4 W. The best bea m quality had diode lasers with a 2-mum-thick waveguide, at the expense of a reduced temperature stability.