New developments in X-ray topography of advanced non-metallic materials

X-ray topography is characterised by the spatially resolved detection of sc attering from a sample. It combines both the advantages of radiographic ima ging and the analytical information of X-ray scattering like wide- and smal l-angle diffraction, refraction and total reflection. Scanning techniques u nder small- and wide-angle scattering conditions permit the topographic cha racterisation of any crystalline or amorphous solid or liquid. New topograp hic methods and applications to non-metallics are presented.