IN-SITU SURFACE MONITORING-SYSTEM FOR SYNCHROTRON MIRRORS UNDER HIGH HEAT LOAD

Citation
Ph. Mui et al., IN-SITU SURFACE MONITORING-SYSTEM FOR SYNCHROTRON MIRRORS UNDER HIGH HEAT LOAD, Applied optics, 36(22), 1997, pp. 5546-5551
Citations number
7
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
36
Issue
22
Year of publication
1997
Pages
5546 - 5551
Database
ISI
SICI code
0003-6935(1997)36:22<5546:ISMFSM>2.0.ZU;2-1
Abstract
A portable electro-optical system capable of real-time measurements of surface slope distortions down to 0.5 mu rad is described; the system is limited primarily by its short-term stability. The system employs an angle measurement technique that, in combination with the least-squ ares signal extraction method, reduces system fluctuations, In additio n, a multireflection technique is used to enhance the detectable resol ution, Although designed for use with mirrors for synchrotron radiatio n sources, this system has the flexibility to be applied to other opti cal components. The prototype system has been tested on a sample mirro r piece, and preliminary results are presented. A brief discussion abo ut the extension of this metrology unit to adaptive optics is also giv en. (C) 1997 optical Society of America.