Growth peculiarities of aluminum anodic oxide at high voltages in diluted phosphoric acid

Citation
A. Jagminas et al., Growth peculiarities of aluminum anodic oxide at high voltages in diluted phosphoric acid, J CRYST GR, 233(3), 2001, pp. 591-598
Citations number
34
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
233
Issue
3
Year of publication
2001
Pages
591 - 598
Database
ISI
SICI code
0022-0248(200112)233:3<591:GPOAAO>2.0.ZU;2-W
Abstract
The growth of porous aluminium anodic oxide films on 99.5%, 99.99% and 99.9 99% purity Al metal in stirred dilute phosphoric acid solutions (0.005-0.4 mol l(-1)) at 2-20 degreesC temperature and relative high anodizing voltage s was studied. A kinetic model is proposed for solutions of concentration u p to 0.1 mol l(-1). The size of cells in the films formed in dilute phospho ric acid solution varies linearly with the anodizing voltage with a proport ionality coefficient varying from 2.67 to 2.25 at electrolyte concentration s from 0.2 to 0.025 mol l(-1), respectively. On the basis of the variation of oxide film mass, current density and Al volume expansion factor with ano dizing time, conditions for the formation of highly ordered pore arrays may be predicted. (C) 2001 Published by Elsevier Science B.V.