Dynamic mixing deposition of niobium nitride films by cathodic are plasma in ambient nitrogen

Citation
T. Zhang et al., Dynamic mixing deposition of niobium nitride films by cathodic are plasma in ambient nitrogen, J VAC SCI A, 19(5), 2001, pp. 2048-2050
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
19
Issue
5
Year of publication
2001
Pages
2048 - 2050
Database
ISI
SICI code
0734-2101(200109/10)19:5<2048:DMDONN>2.0.ZU;2-U
Abstract
Two cathodic are plasma deposition processes have been used to deposit niob ium nitride films in ambient nitrogen: (a) cathodic are plasma deposition w ithout dynamic mixing and (b) cathodic arc plasma deposition with, energeti c ion dynamic mixing. Smooth and continuous niobium nitride films were fabr icated at low temperature in process (b) but at higher temperature (500 deg reesC) in process (a). The effects of the substrate temperature on the film composition and preferred orientation were investigated. In process (a), f ilms deposited at room temperature and 300 degreesC exhibited a preferred o rientation of (220) whereas those deposited at 500 degreesC showed a prefer red orientation of (200). The nitrogen content in the film synthesized in p rocess (b) is higher than that in the films deposited in process (a). Our r esults show that with energetic ion dynamic mixing, niobium nitride films w ith excellent properties can be fabricated at low substrate temperature usi ng a niobium metal arc plasma source in a nitrogen plasma immersion configu ration. (C) 2001 American Vacuum Society.