T. Zhang et al., Dynamic mixing deposition of niobium nitride films by cathodic are plasma in ambient nitrogen, J VAC SCI A, 19(5), 2001, pp. 2048-2050
Two cathodic are plasma deposition processes have been used to deposit niob
ium nitride films in ambient nitrogen: (a) cathodic are plasma deposition w
ithout dynamic mixing and (b) cathodic arc plasma deposition with, energeti
c ion dynamic mixing. Smooth and continuous niobium nitride films were fabr
icated at low temperature in process (b) but at higher temperature (500 deg
reesC) in process (a). The effects of the substrate temperature on the film
composition and preferred orientation were investigated. In process (a), f
ilms deposited at room temperature and 300 degreesC exhibited a preferred o
rientation of (220) whereas those deposited at 500 degreesC showed a prefer
red orientation of (200). The nitrogen content in the film synthesized in p
rocess (b) is higher than that in the films deposited in process (a). Our r
esults show that with energetic ion dynamic mixing, niobium nitride films w
ith excellent properties can be fabricated at low substrate temperature usi
ng a niobium metal arc plasma source in a nitrogen plasma immersion configu
ration. (C) 2001 American Vacuum Society.