Effects of thermal annealing on the interface morphology of CdTe/CdS heterojunctions

Authors
Huang, S Soo, YL Kao, YH Compaan, AD
Citation
S. Huang et al., Effects of thermal annealing on the interface morphology of CdTe/CdS heterojunctions, J VAC SCI A, 19(5), 2001, pp. 2181-2185
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
19
Issue
5
Year of publication
2001
Pages
2181 - 2185
Database
ISI
SICI code
0734-2101(200109/10)19:5<2181:EOTAOT>2.0.ZU;2-O
Abstract
The effects of thermal annealing on CdTe/CdS heterojunctions have been inve stigated by means of the grazing incidence x-ray scattering technique. Chan ges in the interface morphology due to heat treatment are characterized qua ntitatively in terms of a set of parameters including the interfacial rough ness and correlation lengths of the layer thickness fluctuations. (C) 2001 American Vacuum Society.