Special issue - 12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

Authors
Labat, N Touboul, A
Citation
N. Labat et A. Touboul, Special issue - 12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, MICROEL REL, 41(9-10), 2001, pp. IX-IX
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
41
Issue
9-10
Year of publication
2001
Pages
IX - IX
Database
ISI
SICI code
0026-2714(200109/10)41:9-10<IX:SI-1ES>2.0.ZU;2-8