Front side and backside OBIT mappings applied to single event transient testing

Authors
Lewis, D Pouget, V Beauchene, T Lapuyade, H Fouillat, P Touboul, A Beaudoin, F Perdu, P
Citation
D. Lewis et al., Front side and backside OBIT mappings applied to single event transient testing, MICROEL REL, 41(9-10), 2001, pp. 1471-1476
Citations number
6
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
41
Issue
9-10
Year of publication
2001
Pages
1471 - 1476
Database
ISI
SICI code
0026-2714(200109/10)41:9-10<1471:FSABOM>2.0.ZU;2-G
Abstract
A new experimental set-up dedicated to front side and backside picosecond O BIC testing is presented. Applications for fundamental study of integrated circuits are presented. Front side and backside OBIC images of an analog in tegrated circuit show the potentiality and the suitability of this new equi pment an methodology for laser testing of VLSI circuits. (C) 2001 Elsevier Science Ltd. All rights reserved.