Coaxial ion-photon system

Citation
Cc. Tsao et al., Coaxial ion-photon system, MICROEL REL, 41(9-10), 2001, pp. 1483-1488
Citations number
4
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
41
Issue
9-10
Year of publication
2001
Pages
1483 - 1488
Database
ISI
SICI code
0026-2714(200109/10)41:9-10<1483:CIS>2.0.ZU;2-7
Abstract
A novel dual beam column is presented in which the light beam of an optical microscope is coaxial with the focused ion beam (FIB). The FIB using a LMI S delivers a 30keV, gallium ion beam with simulated minimal beam size of 10 nm diameter. With a Schwarzschild objective module integrated into the FEB objective system, the optical microscope is able to provide simultaneously both a 34x diffraction-limited optical image with a live FEB image. System performance of this "OptiFIB" is characterized and potential applications a re discussed. (C) 2001 Elsevier Science Ltd. All ri.-hts reserved.