A new versatile testing interface for failure analysis in integrated circuits

We developed a new versatile testing interface that can keep a device in th e proper electrical state for defect localization. It makes it possible to configure the circuit by plugging the interface to an electrical tester or a switching matrix. For the applications, this small interface is carried t o the emission microscope for light emission, TIVA, and other laser techniq ues.. The circuit can then be analyzed while being in the proper electrical test. It offers the advantage of simple connections (e.g.; for a 256 pin c ount device) and reduced noise compared too long cable connection used betw een the microscope chamber and the outside. (C) 2001 Elsevier Science Ltd. Ail rights reserved.