Non-destructive tester for single event burnout of power diodes

Authors
Busatto, G Iannuzzo, F Velardi, F Wyss, J
Citation
G. Busatto et al., Non-destructive tester for single event burnout of power diodes, MICROEL REL, 41(9-10), 2001, pp. 1725-1729
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
41
Issue
9-10
Year of publication
2001
Pages
1725 - 1729
Database
ISI
SICI code
0026-2714(200109/10)41:9-10<1725:NTFSEB>2.0.ZU;2-0
Abstract
A protection circuit for power diodes under heavy ion bombardment is presen ted, which allows to acquire failure waveforms without destroying the devic e under test. An ultra-fast, high voltage switch based on eight vacuum tube s is employed to short the device within less than 100ns from the potential ly destructive impact. Some waveforms have been safely acquired in conditio ns where the device could have been destroyed in absence of protection. (C) 2001 Elsevier Science Ltd. All rights reserved.