Jk. Lomness et al., Site-specific transmission electron microscope characterization of micrometer-sized particles using the focused ion beam lift-out technique, MICROS MICR, 7(5), 2001, pp. 418-423
Micrometer sized particles have been studied to show that a high-quality tr
ansmission electron microscope (TEM) specimen can be produced, without the
use of embedding media, from a site-specific region of chosen particles usi
ng the focused ion beam (FIB) lift-out (LO) technique. The uniqueness of th
is technique is that site-specific TEM LO specimens maybe obtained from par
ticles and from regions which are smaller than the conventional similar to
10-20 mum x 5 mum x similar to0.1 mum dimensions of the LO specimen. The in
novative FIB LO procedures are described in detail and TEM images of electr
on transparent specimens obtained from specific micrometer-sized particles
are presented.