Dd. Ladipo et Vm. Puri, COMPUTER-CONTROLLED SHEAR CELL FOR MEASUREMENT OF FLOW PROPERTIES OF PARTICULATE MATERIALS, Powder technology, 92(2), 1997, pp. 135-146
A shear tester for powders that allows the determination of a dynamic
yield locus from a single test was built and tested. The principle of
the computer controlled shear cell (CCSC) is that dynamic yield states
can be maintained in a test cell over a range of normal and shear str
esses in the same test. This leads directly to a dynamic yield locus.
With its flexible design, the CCSC can also be used as a Jenike shear
cell or a direct shear cell. The performance of the CCSC used as a dyn
amic yield locus tester (YLT) was compared with the CCSC used as a Jen
ike shear cell. Wheat flour and sugar were the test materials. The yie
ld loci obtained with the CCSC-YLT using fine cohesive material, wheat
hour, were not statistically different (at the 95% confidence interva
l) from the yield loci obtained with the CCSC-Jenike, while there were
marginal differences (at the 95% confidence interval) between the tes
ters for the less cohesive material, granulated sugar. Design of the C
CSC also eliminated the need for trial and error in determining the nu
mber of twists needed for critical consolidation of powder mass. In ad
dition, the duration of the test and amount of material needed to gene
rate a dynamic yield locus using the CCSC are reduced by 3/4 and 2/3,
respectively, compared with those required for the CCSC used as a Jeni
ke shear cell.