Results of radiation test of the cathode front-end board for CMS endcap muon chambers

After a brief overview of the CMS EMU electronics system, results on radiat ion induced single event effects, total ionization dose and displacement ef fects will be reported. These results are obtained by irradiating the compo nents on electronics boards with 63 MeV protons and I MeV neutrons. During the proton irradiation, the electronics board was fully under power, all co mponents on the board were active and the data were read out in the same wa y as designed for CMS. No deterioration of analog performance for each of t he three CMOS ASICs on the tested board was observed, up to a dose of 10 kr ad. Each of the tested FPGAs survived beyond the dose of 30 krad. No single event latch-up was detected for the CMOS ASICs up to a proton fluence of 2 x 10(12) cm(-2). Single Event Upsets (SEU) in FPGAs were detected and thei r cross-sections measured. SEU mitigation with triple module redundancy and voting was implemented and tested. (C) 2001 Elsevier Science B.V. All righ ts reserved.