A new method has been developed for obtaining continuous stopping power cur
ves in transmission geometry. In the method both the incident energy of the
particle and its energy after passing through the sample foil are extracte
d directly from the semiconductor detector. Full range of energies is measu
red simultaneously eliminating step-by-step measurements and providing cont
inuous data. A time-of-flight (TOF) spectrometer provides unambiguous match
ing of relevant particle groups from the run with and without absorber. Sui
table energy distribution of incident particles was achieved by choosing th
e right thickness and tilting angle of a scattering foil. The method is ver
y fast and reliable. Sample results for stopping power values for Ar-40 in
Au, Ni, and polycarbonate are presented and compared with SRIM-2000 calcula
tions. It is proposed to adopt a suitable standard for specific energy loss
measurements to avoid possible discrepancies in energy calibration, For in
stance, Au or C would be good reference materials and all the new high prec
ision data should be quoted not only in absolute values but also relative t
o the standard material that was measured with the same set-up. Our new met
hod provides sufficient accuracy and speed to make such an approach feasibl
e. (C) 2001 Elsevier Science B.V. All rights reserved.