Electrodeposition and characterization of ZnSe semiconductor thin films

In this work, results on the preparation and characterization of ZnSe thin films obtained by electrodeposition are presented. Voltammetric curves were recorded in order to characterize the electrochemical behavior of the Zn+2 /SeO2 system on different substrates. Thin films were deposited potentiosta tically from an unstirred, deareated aqueous solution onto titanium, glass substrates coated with fluorine doped tin oxide and ITO glass substrates. T he effect of main parameters such as the deposition potential, SeO2 concent ration and annealing on film composition and structure were analyzed. The a s-grown and treated layers were characterized by X-ray energy dispersive an alysis, X-ray diffraction, scanning electron microscopy and photoelectroche mical studies. Optical measurements were done on these samples which gave a clear band edge near 2.6eV quite close to the accepted room temperature va lue of 2.7eV for ZnSe. (C) 2001 Elsevier Science BN. All rights reserved.