Q. Zhang et al., Worst-case analysis and statistical simulation of MOSFET devices based on parametric test data, SOL ST ELEC, 45(9), 2001, pp. 1537-1547
A practical and efficient approach for estimating the MOSFET device and cir
cuit performance distributions is presented. The proposed method is based o
n the Latin hypercube sampling technique and direct extracting and utilizin
g the statistical information obtained from a population of parametric test
data. Using this approach, a set of worst-case models taking into account
data correlations and equal probability constraints is developed. The proce
dure allows for a systematical and accurate way to predict the performance
spread and worst case of MOSFET circuits, as well as a greatly reduced comp
utation time for statistical simulation. Measured data of two digital circu
its are included in support of the modeling work. (C) 2001 Elsevier Science
Ltd. All rights reserved.