K. Singh et al., Effect of nitrogen partial pressure on the electrochemical evaluation of (Ti-Al)N coatings deposited by reactive magnetron sputtering, T I MET FIN, 79, 2001, pp. 190-194
Titanium aluminium nitride films were deposited on stainless steel substrat
es by reactive magnetron sputtering under various nitrogen partial pressure
s, using a composite target consisting of alternate arc segments of titaniu
m and aluminium. Electrochemical evaluation of these coatings, carried out
by the potentiodynamic measurement technique in deaerated 1N H2SO4 solution
at room temperature, has shown that initially there is a rapid increase in
corrosion resistance of the coatings with increase in partial pressure of
nitrogen; a further increase in nitrogen partial pressure leads to a much l
ower increase in the corrosion rate. The corrosion potential (E-corr) incre
ased from -339.8 to -268.0 mV with the increase in nitrogen partial pressur
e from 0.18 to 0.63 mtorr With further increase in partial pressure of nitr
ogen to 1.08 mtorr, E-corr decreased to -303.6 mV The corrosion current den
sity (I-corr) was found to be least 4.6 muA cm(-2) at nitrogen partial pres
sure of 1.08 mtorr. Coatings were characterized by X-ray diffraction phase
analysis, which showed the presence of microcrystalline cubic TiN structure
for nitrogen partial pressures of up to 0.88 mtorr. A cubic TW plus hexago
nal AlN structure was present at 0.98 mtorr, while only hexagonal AlN struc
ture was observed at 1.08 mtorr nitrogen partial pressure. Surface hardness
measured by microhardness tester using a Knoop indenter showed an increase
in surface hardness values with increase in partial pressure of nitrogen.
The maximum hardness of 2790 HK25 was observed at a nitrogen partial pressu
re of 0.98 mtorr. At nitrogen partial pressure of 1.08 mtorr the hardness v
alue decreased drastically to 1746 HK25.