Impurity-controlled dopant activation: Hydrogen-determined site selection of boron in silicon carbide

Citation
B. Aradi et al., Impurity-controlled dopant activation: Hydrogen-determined site selection of boron in silicon carbide, APPL PHYS L, 79(17), 2001, pp. 2746-2748
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
17
Year of publication
2001
Pages
2746 - 2748
Database
ISI
SICI code
0003-6951(20011022)79:17<2746:IDAHSS>2.0.ZU;2-H
Abstract
The geometry and formation energy of substitutional B and Al dopants as wel l as their complexes with hydrogen have been calculated in 4H-SiC using fir st-principles methods. Our results show that boron selecting the silicon si te and, therefore, getting activated as a shallow acceptor depends on the p resence of hydrogen which is promoted into the crystal by boron itself. Wit hout hydrogen, boron would mostly be incorporated at the carbon site. Alumi num does not show this behavior: it always selects the silicon site and is incorporated independently of hydrogen. (C) 2001 American Institute of Phys ics.