The microstructures of Cu layers, ranging in thickness from 3 to 12 mum, we
re investigated, The layers were electrodeposited from an acidic copper ele
ctrolyte onto two distinct substrate materials important for the micro-comp
onents industry: an Au layer with a pronounced < 1 1 1 > -texture, and a na
no-crystalline Ni-P layer. The evolutions of surface topography, morphology
and crystallographic texture in the layers were investigated with scanning
electron microscopy (SEM), transmission electron microscopy (TEM) and X-ra
y diffraction analysis, respectively. Distinct surface topographies were ob
served for Cu layers deposited on the Au and Ni-P substrates. Deposition on
to the An substrate resulted in a very smooth surface of all Cu layers, whe
reas the Ni-P substrate caused an irregular surface for 3-mum-thick layers
of Cu. The crystallographic texture in the Cu layers in the first few micro
metres depended strongly on the crystallographic texture in the substrate.
The Cu crystallites inherited the < 1 1 1 > -orientation of the Au substrat
e, whilst no preferred crystallographic orientation was observed in the Cu
crystallites on the nano-crystalline Ni-P substrate. For Cu layers thicker
than 3 pm a <1 1 0 > -fibre texture developed on both the substrates. (C) 2
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