Modelling polarisation of ferroelectric SBT capacitors including temperature dependence

Authors
Schultz, I Goebel, H Ullmann, M
Citation
I. Schultz et al., Modelling polarisation of ferroelectric SBT capacitors including temperature dependence, ELECTR LETT, 37(20), 2001, pp. 1216-1217
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS LETTERS
ISSN journal
00135194 → ACNP
Volume
37
Issue
20
Year of publication
2001
Pages
1216 - 1217
Database
ISI
SICI code
0013-5194(20010927)37:20<1216:MPOFSC>2.0.ZU;2-M
Abstract
A new model for thin film SBT ferroelectric capacitors including temperatur e behaviour is presented. The model, which is based on the Preisach theory, requires parameters that are physically based and which can be easily extr acted from measured data. Iterative procedures are not used in the model, w hich makes it best suited for use in circuit simulators.