Specular x-ray reflectivity study of ordering in self-assembled organic and hybrid organic-inorganic electro-optic multilayer films

Specular x-ray reflectivity has been used to probe the microstructures of s iloxane-based self-assembled electro-optic superlattices composed of high-h yperpolarizable organic chromophore arrays intercalated with Ga and In oxid e sheets. The film thickness increases linearly as a function of the number of layers, underscoring the high structural regularity and efficiency of t he synthetic approach. Relatively dense metal oxide structures are detected in these systems. The x-ray reflectivity data also indicate that the depen dence of the relative surface roughness on the number of layers is nearly i dentical for self-assembled organic and organic-inorganic hybrid film struc tures. (C) 2001 American Institute of Physics.