The formation process of CdSe self-assembled quantum dots (SAQDs) was inves
tigated systematically by atomic force microscopy (AFM). Several monolayers
(MLs) of CdSe coverage were grown directly on GaAs substrates by metalorga
nic chemical vapor deposition (MOCVD). AFM images were taken constantly on
the same area within several hours after the growth. It revealed that the r
elaxation of misfit strain is completed by two competing processes. One is
the formation of quantum dots assisted by surface diffusions another is the
formation of misfit dislocations. (C) 2001 Elsevier Science B.V. All right
s reserved.