DX centers in indium-doped Cd0.9Mn0.1Te

Citation
E. Placzek-popko et al., DX centers in indium-doped Cd0.9Mn0.1Te, OPT MATER, 18(1), 2001, pp. 163-165
Citations number
4
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
OPTICAL MATERIALS
ISSN journal
09253467 → ACNP
Volume
18
Issue
1
Year of publication
2001
Pages
163 - 165
Database
ISI
SICI code
0925-3467(200110)18:1<163:DCIIC>2.0.ZU;2-6
Abstract
Deep levels in indium-doped Cd0.9Mn0.1Te material were studied by DLTS, the rmally stimulated capacitance (TSC) and photocapacitance measurements. The persistent photoeffects observed at low temperature indicate existence of m etastable centers in the material. One of the trap related to metastable de fects has been identified: the level with activation energy obtained from D LTS studies equal to 0.22 eV, a very high concentration of the associated t raps (higher than 10% of the concentration of the shallow levels) and energ y barrier for capture equal to 0.1 eV. Stokes shift for this level has been found to be equal to 0.58 eV. (C) 2001 Elsevier Science B.V. All rights re served.