Micro-structural analysis of YBa2Cu3O7-x thin films grown on different substrates by X-ray techniques

YBa2Cu3Ox (YBCO) thin films grown on different substrates with and/or witho ut Eu2CuO4 (ECO) buffer layer were investigated by X-ray wide angle diffrac tion, reflection, diffuse scattering and topography. The results show that for the yttria stabilized ZrO2 (YSZ) substrate, the presence of an ECO buff er layer improves the crystalline quality of the YBCO film, while a negativ e effect is observed for the SrTiO3 (STO) substrate. The lateral correlatio n length for a sample grown on a YSZ substrate with ECO buffer layer is muc h greater than that grown on an STO substrate. The STO substrate used has m osaic structure. (C) 2001 Elsevier Science B.V. All rights reserved.