300mm fab automation can meet advanced defect detection needs

Citation
R. Spicer et al., 300mm fab automation can meet advanced defect detection needs, SOL ST TECH, 44(10), 2001, pp. 54
Citations number
6
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
SOLID STATE TECHNOLOGY
ISSN journal
0038111X → ACNP
Volume
44
Issue
10
Year of publication
2001
Database
ISI
SICI code
0038-111X(200110)44:10<54:3FACMA>2.0.ZU;2-U
Abstract
Built-in particle inspection is not likely to provide benefit over a compre hensive standalone inspection approach that is facilitated by 300mm fab aut omation and robotics. Among other justifications, significant time-to-detec t benefits may be achievable through optimized automation and robot- ics su pport and fab layout without the loss of flexibility. This avoids the added capital cost associated with built-in detection, which may offer little in cremental benefit once automation and fab layout are optimized.