Optical emission from ultrathin strained type-II InP/GaP quantum wells

Citation
F. Hatami et al., Optical emission from ultrathin strained type-II InP/GaP quantum wells, APPL PHYS L, 79(18), 2001, pp. 2886-2888
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
18
Year of publication
2001
Pages
2886 - 2888
Database
ISI
SICI code
0003-6951(20011029)79:18<2886:OEFUST>2.0.ZU;2-Z
Abstract
We describe the growth and optical emission from ultrathin strained InP qua ntum wells grown on GaP substrates using gas-source molecular-beam epitaxy. The InP thickness was varied between 0.5 and 1.6 monolayers. Intense photo luminescence was emitted from the structures; time-resolved measurements in dicate rather long carrier lifetimes of about 19 ns. With decreasing InP co verage, the emission lines are shifted from 2.18 to 2.28 eV due to quantum size effects. We explain the emission as spatially indirect recombination o f electrons from the GaP X valleys with holes in InP and its phonon replica s. (C) 2001 American Institute of Physics.