Electric field-induced junctions in epitaxial layers of CuInSe2

Citation
K. Gartsman et al., Electric field-induced junctions in epitaxial layers of CuInSe2, APPL PHYS L, 79(18), 2001, pp. 2919-2921
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
18
Year of publication
2001
Pages
2919 - 2921
Database
ISI
SICI code
0003-6951(20011029)79:18<2919:EFJIEL>2.0.ZU;2-I
Abstract
Epitaxial films of CuInSe2 on Si(111) were modified by the application of a n electric field through a movable tip. The electric field induces stable j unction regions which are identified by efficient separation and collection of electron beam-induced charge carriers. The movable tip allows for scrib ing of these junction regions. The junctions can be explained by symmetrica l p/p(+)/n/p(+)/p regions formed within the CuInSe2 epilayers. The reported method presents an alternate way for junction patterning in two dimensions . (C) 2001 American Institute of Physics.