Niobate-based microwave dielectrics suitable for third generation mobile phone base stations

Citation
H. Hughes et al., Niobate-based microwave dielectrics suitable for third generation mobile phone base stations, APPL PHYS L, 79(18), 2001, pp. 2952-2954
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
18
Year of publication
2001
Pages
2952 - 2954
Database
ISI
SICI code
0003-6951(20011029)79:18<2952:NMDSFT>2.0.ZU;2-8
Abstract
High unloaded quality factor (Q(u)), zero temperature coefficient of resona nt frequency (tau (f)) and high relative permittivity (epsilon (r)) microwa ve dielectric ceramics have been fabricated based on BaZn1/3Nb2/3O3. Proper ties have been optimized for the composition, 0.9Ba([Zn0.60Co0.40](1/3)Nb-2 /3)O-3-0.1Ba(Ga0.5Ta0.5)O-3 for which Q(u)=32 000 @ 3.05 GHz, epsilon (r)=3 5, and tau (f)=0. The new compounds are disordered according to x-ray diffr action (XRD) and may be indexed using a simple perovskite unit cell, a=4.09 Angstrom. Small peaks (e.g., d approximate to3.01 Angstrom, relative inten sity, 4.5) attributed to a barium niobate second phase are also present in XRD patterns. These ceramics are suitable in terms of cost and performance for base stations supporting third generation architecture. (C) 2001 Americ an Institute of Physics.