H. Hughes et al., Niobate-based microwave dielectrics suitable for third generation mobile phone base stations, APPL PHYS L, 79(18), 2001, pp. 2952-2954
High unloaded quality factor (Q(u)), zero temperature coefficient of resona
nt frequency (tau (f)) and high relative permittivity (epsilon (r)) microwa
ve dielectric ceramics have been fabricated based on BaZn1/3Nb2/3O3. Proper
ties have been optimized for the composition, 0.9Ba([Zn0.60Co0.40](1/3)Nb-2
/3)O-3-0.1Ba(Ga0.5Ta0.5)O-3 for which Q(u)=32 000 @ 3.05 GHz, epsilon (r)=3
5, and tau (f)=0. The new compounds are disordered according to x-ray diffr
action (XRD) and may be indexed using a simple perovskite unit cell, a=4.09
Angstrom. Small peaks (e.g., d approximate to3.01 Angstrom, relative inten
sity, 4.5) attributed to a barium niobate second phase are also present in
XRD patterns. These ceramics are suitable in terms of cost and performance
for base stations supporting third generation architecture. (C) 2001 Americ
an Institute of Physics.