A simulation of naphthalene matrix isolation: comparison with experiments

Citation
C. Crepin et al., A simulation of naphthalene matrix isolation: comparison with experiments, CHEM PHYS, 272(2-3), 2001, pp. 243-258
Citations number
38
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CHEMICAL PHYSICS
ISSN journal
03010104 → ACNP
Volume
272
Issue
2-3
Year of publication
2001
Pages
243 - 258
Database
ISI
SICI code
0301-0104(20011015)272:2-3<243:ASONMI>2.0.ZU;2-J
Abstract
The trapping of a naphthalene molecule in an argon matrix is simulated usin g an original method based on classical molecular dynamics calculations. A numerical simulation of the gas mixture deposition on a cold argon surface reproduces the matrix growing process. Three main trapping sites are obtain ed. The naphthalene replaces four or five argon atoms in the (111) crystall ographic plane, or four argon atoms in the (001) crystallographic plane of the fcc argon lattice structure. The simulated structures are correlated to experimental site effects: the spectroscopic and dynamic molecular propert ies depend only on the lattice plane occupied by the naphthalene. (C) 2001 Elsevier Science B.V. All rights reserved.