Increasing the photoluminescence intensity of Ge islands by chemical etching

Citation
F. Gao et al., Increasing the photoluminescence intensity of Ge islands by chemical etching, CHIN PHYS, 10(10), 2001, pp. 966-969
Citations number
12
Categorie Soggetti
Physics
Journal title
CHINESE PHYSICS
ISSN journal
10091963 → ACNP
Volume
10
Issue
10
Year of publication
2001
Pages
966 - 969
Database
ISI
SICI code
1009-1963(200110)10:10<966:ITPIOG>2.0.ZU;2-3
Abstract
Self-assembled Ge islands were grown on Si(100) substrate by Si2H6-Ge molec ular beam epitaxy. After being subjected to chemical etching, it is found t hat the photoluminescence from the etched Ge islands became more intense an d shifted to the higher-energy side compared to that of the as-deposited Ge islands. This behaviour was explained by the effect of chemical etching on the morphology of the Ge islands. Our results demonstrate that chemical et ching can be a way to change the luminescence property of the as-deposited islands.