A. Isobe et al., ELECTRONIC-STRUCTURE AND ELECTRICAL-CONDUCTIVITY OF AMORPHOUS NI-SI ALLOY-FILMS, Journal of the Physical Society of Japan, 66(7), 1997, pp. 2103-2109
The NixSi100-x system forms a homogeneous amorphous phase over wide ra
nges of composition (0 less than or equal to x less than or equal to 3
4 and 63 less than or equal to x less than or equal to 73) when the al
loy is deposited on a substrate by sputtering at ambient temperature.
The electrical conductivity of the amorphous alloy changes characteris
tically with Ni concentration from a semiconductor-like temperature de
pendence to a metallic one: the transition taking place between 10.4 a
nd 16.6% Ni. UPS valence band spectra show that the density of states
at the Fermi level is minimal below about 7% Ni, but emerges abruptly
above this concentration. The relationship between the electrical tran
sport properties and the electronic structure of the amorphous alloys
is discussed in three characteristic regions of the Ni concentration.