Real-part EXAFS from multilayer Bragg reflections: a promising new EXAFS technique

Resonant X-ray scattering measurements on the energy dependence of multilay er Bragg reflections are presented. It is shown that the deviations from th e ideal Bragg law at resonance are due to refraction, which allows a determ ination of the real part of the extended X-ray absorption fine-structure (E XAFS) function. With this new technique, it is possible to obtain phase-sen sitive EXAFS information without the di cult data analysis and absorption c orrections required by the diffraction anomalous fine-structure technique.