The crystallochemical characteristics of polycrystalline samples, Sr1-
xLaxAlO4, Sr1-xNdxAlO4 (x = 0.02 divided by 0.20) and Sr1-xBixNdAlO4 (
x = 0.05 divided by 0.50) prepared by the oxalate coprecipitation and
cryochemical technique have been investigated. The existence limits of
single-phase states for pairs of elements Sr-Pb (x < 0.05) and Nd-Bi
(x < 0.2) were determined. The microprobe S-ray analysis showed the Bi
uniform distribution, The dielectric properties of pore SrLaAlO4, SrL
aGaO4 and partial replacement La-Nd samples were measured. It can be c
oncluded that these compounds are suitable as substrate materials of H
TSC thin films.