Particle beam and X-ray imaging with thin CsI scintillating plates

Citation
L. Cosentino et P. Finocchiaro, Particle beam and X-ray imaging with thin CsI scintillating plates, IEEE NUCL S, 48(4), 2001, pp. 1132-1136
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Nuclear Emgineering
Journal title
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
ISSN journal
00189499 → ACNP
Volume
48
Issue
4
Year of publication
2001
Part
1
Pages
1132 - 1136
Database
ISI
SICI code
0018-9499(200108)48:4<1132:PBAXIW>2.0.ZU;2-E
Abstract
At the Laboratori Nazionali del Sud (LNS), Catania, Italy, in the framework of digital radiography and ion beam diagnostics, the use of thin monocryst al scintillating plates made from CsI(TI) has allowed us to obtain promisin g results in terms of high sensitivity, compactness, and handiness. In both techniques, a charge-coupled device camera is used to observe the light pr oduced in the crystal when it is crossed by X-rays, in case of radiography, or by charged particles, in case of beam imaging. Spatial resolution has b een measured with X-rays as a function of the plate thickness (100 mum to 2 mm), and particular care has been taken in order to perform the imaging of low-intensity radioactive beams (I-beam < 10(5) pps) that will be produced with the EXCYT facility at LNS.