Atomic Spectrometry Update. X-ray fluorescence spectrometry

Citation
Pj. Potts et al., Atomic Spectrometry Update. X-ray fluorescence spectrometry, J ANAL ATOM, 16(10), 2001, pp. 1217-1237
Citations number
417
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
ISSN journal
02679477 → ACNP
Volume
16
Issue
10
Year of publication
2001
Pages
1217 - 1237
Database
ISI
SICI code
0267-9477(2001)16:10<1217:ASUXFS>2.0.ZU;2-Q
Abstract
This annual review of X-ray fluorescence covers developments over the perio d 2000-2001 in instrumentation and detectors, matrix correction and spectru m analysis software, X-ray optics and microfluorescence, synchrotron XRF, T XRF, portable XRF and on-line applications as assessed from the published l iterature. The review also covers a survey of applications, including sampl e preparation, geological, environmental, archaeological, forensic, biologi cal, clinical, thin films, chemical state and speciation studies. During th e current review period, publications have demonstrated the development of sub-100 nm X-ray beams for SR microprobe analysis together with the wider u se of WD spectrometers in this application. There is evidence of an extensi on of the application of XRF as a reference technique, with XRF increasingl y being used in modern laboratories in place of older wet-chemical methods, and computer-modelling studies continue to be popular in extending the und erstanding of various XRF phenomena. Some interesting work has been underta ken in the measurement of radiative Auger effects using high-resolution WDX RF instruments. However, the potential for future developments in XRF is il lustrated by research into ultra-high resolution microcalorimeter detector devices, which are still at the experimental stage and have not yet progres sed to the status of useful practical devices.