DEPTH PROFILING OF CATHODIC DEUTERIUM IN PURE IRON IMPLANTED WITH TITANIUM OR CARBON

Authors
BRASS AM CHENE J BOUTRYFORVEILLE A
Citation
Am. Brass et al., DEPTH PROFILING OF CATHODIC DEUTERIUM IN PURE IRON IMPLANTED WITH TITANIUM OR CARBON, Corrosion science, 39(8), 1997, pp. 1469-1480
Citations number
17
Categorie Soggetti
Metallurgy & Metallurigical Engineering
Journal title
Corrosion science → ACNP
ISSN journal
0010938X
Volume
39
Issue
8
Year of publication
1997
Pages
1469 - 1480
Database
ISI
SICI code
0010-938X(1997)39:8<1469:DPOCDI>2.0.ZU;2-U
Abstract
Titanium and carbon implantation of iron lead to amorphous films. Thei r influence on hydrogen diffusion and trapping in iron was investigate d by SIMS profiling of deuterium introduced by cathodic charging. Carb on implanted ''amorphous diamond'' films are more efficient in reducin g the hydrogen entry in iron. (C) 1997 Elsevier Science Ltd.